Abstract
Infrared absorption bands for 15N in crystalline silicon have been observed for the first time. Isotopic substitution experiments were performed by N+ ion implantation into crystalline silicon to confirm the role of nitrogen in absorption bands at 764 and 962 cm−1 for 14N and at 748 and 937 cm−1 for 15N. Laser annealing increases the intensity of the higher frequency band. The 962-cm−1 band frequency is close to Si-N stretch frequencies for planar bonded N in crystalline Si3N4. It is suggested that the lower frequency band is associated with a mode that is made IR active by local distortion, consistent with a distorted substitutional N center identified by Brower in electron paramagnetic resonance studies on laser-annealed nitrogen-implanted Si.