Epitaxial growth of indium antimonide films as studied in situ by electron diffraction
- 1 January 1968
- journal article
- Published by Elsevier in Surface Science
- Vol. 9 (2) , 306-324
- https://doi.org/10.1016/0039-6028(68)90180-5
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Electron Diffraction Studies of the Epitaxy of Cu Single Crystals. I. Epitaxy of Evaporated Cu Films on Cu CrystalsJournal of Applied Physics, 1966
- On the formation of single crystal films of F.C.C. metals on alkali halide cleavage planes in ultrahigh vacuumPhysica Status Solidi (b), 1966
- Crystal growth and orientation in sputtered films of bismuth telluridePhilosophical Magazine, 1964
- Indium antimonide—A review of its preparation, properties and device applicationsSolid-State Electronics, 1962
- CVI. The sensitivity of electron diffraction as a means of detecting thin surface films: IJournal of Computers in Education, 1955