A SIMS and AES examination of a Cu/Co/Si alloy
- 1 October 1979
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 1 (5) , 139-143
- https://doi.org/10.1002/sia.740010502
Abstract
The present paper deals with SIMS and AES examination of the layer structure developing during the annealing of a Cu/Co/Si alloy. It was discovered from the spectra and Auger images that there is a significant local increase of the concentration of the alloying materials. A surface layer develops during heat treatment of the alloy sample. We prove the presence of CoSi clusters and the joint enrichment of Si and Co.Keywords
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