Determination of built-in field by applying fast Fourier transform to the photoreflectance of surface-intrinsic n+-type doped GaAs
- 18 January 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 74 (3) , 475-477
- https://doi.org/10.1063/1.123040
Abstract
No abstract availableKeywords
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