Nonstandard imaging methods in electron microscopy
- 1 January 1976
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 2 (2-3) , 251-267
- https://doi.org/10.1016/s0304-3991(76)91538-2
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- On differential phase contrast with an extended illumination sourceJournal of the Optical Society of America, 1976
- Origin of the fringe structure observed in high resolution bright-field electron micrographs of amorphous materialsPhilosophical Magazine, 1976
- Electron microscopy of plasmonsPhilosophical Magazine, 1974
- Dreidimensional abbildende Elektronenmikroskope I. Prinzip der Geräte / Threedimensionally Imaging Electron MicroscopesZeitschrift für Naturforschung A, 1972
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Notizen: Zur Defokussierungsabhängigkeit des Phasenkontrastes bei der elektronenmikroskopischen AbbildungZeitschrift für Naturforschung A, 1966
- The scattering of electrons by atoms and crystals. I. A new theoretical approachActa Crystallographica, 1957
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949