Radiation-induced surface leakage currents in silicon microstrip detectors
- 1 June 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (3) , 1746-1750
- https://doi.org/10.1109/23.507215
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Electron paramagnetic resonance and capacitance-voltage studies of ultraviolet irradiated Si-SiO2 interfacesJournal of Applied Physics, 1990