Field oxide radiation damage measurements in silicon strip detectors
- 1 April 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 327 (2-3) , 517-522
- https://doi.org/10.1016/0168-9002(93)90718-w
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- FOXFET biassed microstrip detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991
- Instability of the behaviour of high resistivity silicon detectors due to the presence of oxide chargesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- A Si strip detector with integrated coupling capacitorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1987
- A quasi-static technique for MOS C-V and surface state measurementsSolid-State Electronics, 1970