Automatic generation of functional test pattern for the SCHOLAR system

Publisher Website

9 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 659-662
https://doi.org/10.1109/ciccas.1991.184443

Abstract

No abstract available

Keywords

This publication has 6 references indexed in Scilit:

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IEEE Transactions on Computers, 1982
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers, 1973
Techniques for the diagnosis of switching circuit failures
IEEE Transactions on Communication and Electronics, 1964
Algebraic Topological Methods for the Synthesis of Switching Systems. I
Transactions of the American Mathematical Society, 1958