Low-frequency measurements and modeling of MLC capacitors
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 12 (4) , 613-618
- https://doi.org/10.1109/33.49024
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Capacitance Spectroscopy of Schottky Diodes Formed on Ion-Etched GaAsMRS Proceedings, 1988
- Electrical conduction in polyimide between 20 and 350° CJournal of Electronic Materials, 1987
- Interference narrowing at crossings of sodium Stark resonancesPhysical Review Letters, 1985
- Leakage Currents in Multilayer Ceramic CapacitorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1984
- A barrier model for ZnO varistorsJournal of Applied Physics, 1979
- Capacitance Transient SpectroscopyAnnual Review of Materials Science, 1977
- Absorption currents and steady currents in polymer dielectricsJournal of Non-Crystalline Solids, 1974
- Absorption current, dielectric constant, and dielectric loss by the tunnelling mechanismJournal of Applied Physics, 1973
- A Method for the Determination of High-Field Conduction Laws in Insulating Films in the Presence of Charge TrappingJournal of Applied Physics, 1972
- Physics of Crystalline DielectricsPublished by Springer Nature ,1971