Scanning Tunneling Potentiometry/Spectroscopy (STP/STS)
- 1 November 1989
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 28 (11A) , L2034
- https://doi.org/10.1143/jjap.28.l2034
Abstract
We constructed a scanning tunneling potentiometry/spectroscopy (STP/STS) system which, for the first time, enables us to simultaneously obtain potential and differential conductance images at various tunneling voltages in addition to the usual topographic image. We applied this STP/STS system to the investigation of a granular surface of a variable carbon resistor. As a result, we found that potential drops at the grain boundary, some grains are conductive while others are resistive, and the grain boundaries are highly resistive in several places.Keywords
This publication has 7 references indexed in Scilit:
- Extremely low-noise potentiometry with a scanning tunneling microscopeReview of Scientific Instruments, 1989
- Direct measurement of potential steps at grain boundaries in the presence of current flowPhysical Review Letters, 1988
- Voltage-dependent scanning tunneling microscopy imaging of semiconductor surfacesJournal of Vacuum Science & Technology A, 1988
- Scanning tunneling microscopy and potentiometry on a semiconductor heterojunctionApplied Physics Letters, 1987
- GaAs p n junction studied by scanning tunneling potentiometryApplied Physics Letters, 1986
- Surface Electronic Structure of Si (111)-(7×7) Resolved in Real SpacePhysical Review Letters, 1986
- Scanning tunneling potentiometryApplied Physics Letters, 1986