Lateral manipulation of atomic size defects on the CaF2(111) surface
- 10 March 2006
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 17 (7) , S148-S154
- https://doi.org/10.1088/0957-4484/17/7/s08
Abstract
Atomic scale manipulation on insulating surfaces is one of the great challenges of non-contact atomic force microscopy. Here we demonstrate lateral manipulation of defects occupying single ionic sites on a calcium fluoride (111)-surface. Defects stem from the interaction of the residual gas with the surface. The process of surface degradation is briefly discussed. Manipulation is performed over a wide range of path lengths ranging from tens of nanometres down to a few lattice constants. We introduce a simple manipulation protocol based on line-by-line scanning of a surface region containing defects to be manipulated, and record tip-surface distance and cantilever resonance frequency detuning as a function of the manipulation pathway in real time. We suggest a hopping model to describe manipulation where the tip-defect interaction is governed by repulsive forces.Keywords
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