Density-of-states determination in hydrogenated amorphous silicon obtained from rice husk
- 31 October 1991
- journal article
- Published by Elsevier in Materials Letters
- Vol. 12 (3) , 171-174
- https://doi.org/10.1016/0167-577x(91)90168-6
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Optical, electrical and contact properties of homoCVD a-Si:H filmsJournal of Non-Crystalline Solids, 1985
- NMR and ESR Studies on a-Si:H Prepared by Glow Discharge Decomposition of Si2H6Japanese Journal of Applied Physics, 1985
- Investigations on the production of silicon from rice husks by the magnesium methodMaterials Science and Engineering, 1982
- Kinetics and mechanism of amorphous hydrogenated silicon growth by homogeneous chemical vapor depositionApplied Physics Letters, 1981
- Published by Elsevier ,1980
- Schottky barrier profiles in amorphous silicon-based materialsJournal of Non-Crystalline Solids, 1980
- An investigation of the amorphous-silicon barrier and p-n junctionPhilosophical Magazine Part B, 1978
- Capacitance Energy Level Spectroscopy of Deep-Lying Semiconductor Impurities Using Schottky BarriersJournal of Applied Physics, 1970
- Capacitance of Junctions on Gold-Doped SiliconJournal of Applied Physics, 1968
- Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier SystemJournal of Applied Physics, 1963