A non-destructive X-ray method for the determination of the thickness of surface layers
- 1 August 1951
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 2 (8) , 218-222
- https://doi.org/10.1088/0508-3443/2/8/302
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- A Review of Methods for Coating-Thickness DeterminationJournal of Scientific Instruments, 1949
- A `parallel-beam' concentrating monochromator for X-raysActa Crystallographica, 1948
- An X-Ray Method for Measuring the Thickness of Thin Crystalline FilmsJournal of Applied Physics, 1946
- Design and Operation of an Improved Counting Rate MeterReview of Scientific Instruments, 1946
- Thickness Measurement of Thin Coatings by X—Ray AbsorptionReview of Scientific Instruments, 1946