Small particle adhesion: measurement and control
- 1 May 2000
- journal article
- Published by Elsevier in Colloids and Surfaces A: Physicochemical and Engineering Aspects
- Vol. 165 (1-3) , 11-23
- https://doi.org/10.1016/s0927-7757(99)00442-2
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substratePhysical Review B, 1996
- Surface Roughness and Particle AdhesionThe Journal of Adhesion, 1995
- Adhesion of charged particlesJournal of Adhesion Science and Technology, 1995
- Surface roughness and its influence on particle adhesion using atomic force techniquesJournal of Adhesion Science and Technology, 1995
- Atomic force microscopy adhesion measurements of surface-modified toners for xerographic applicationsColloids and Surfaces A: Physicochemical and Engineering Aspects, 1994
- Adhesion of small particles in electric fieldsJournal of Adhesion Science and Technology, 1994
- Surface force interactions between micrometer-size polystyrene spheres and silicon substrates using atomic force techniquesJournal of Adhesion Science and Technology, 1994
- Interpretation of force curves in force microscopyNanotechnology, 1993
- Contribution of Charge to Powder Particle AdhesionThe Journal of Adhesion, 1972
- Surface energy and the contact of elastic solidsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1971