[001] tilt grain boundaries in YBa2Cu3O7-x thin films
- 31 August 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 37 (1-4) , 326-340
- https://doi.org/10.1016/0304-3991(91)90030-a
Abstract
No abstract availableKeywords
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