Measuring the Very Small Cutting-Edge Radius for a Diamond Tool Using a New Kind of SEM Having Two Detectors
- 1 January 1990
- journal article
- Published by Elsevier in CIRP Annals
- Vol. 39 (1) , 85-88
- https://doi.org/10.1016/s0007-8506(07)61008-7
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Measuring and analysis on cutting edge radius of single point diamond tools using newly developed scanning electron microscope (SEM).Journal of the Japan Society for Precision Engineering, 1990
- Computer Simulation of Profile Changes of Hemi-Spherical Diamond Styli During Ion Beam MachiningCIRP Annals, 1988
- Measurement of Surface Shape by Scanning Electron Microscope Using Detection of NormalCIRP Annals, 1986
- Free dendritic growthMaterials Science and Engineering, 1984
- Microfracture of Diamond as Fine Tool MaterialCIRP Annals, 1982
- A Simplex Method for Function MinimizationThe Computer Journal, 1965