Abstract
This paper comprises studies of: the variation of dielectric constant and lattice parameters with temperature using 'single crystals'; the effects on both of different annealing times; variation with annealing times of order, as deduced from the intensities of superlattice reflections, and of Kanzig region size, as deduced from the breadths of the same reflections. For the dielectric constant, the crystal was annealed in situ. For the lattice parameters, the continuous-recording method was used, giving greater accuracy than in previous investigations. In addition, lattice geometry was checked, and room-temperature lattice parameters measured from twin-spot complexes recorded with Weissenberg cameras and double-radius oscillation cameras.