Characterization of the microstructure of sintered AIN by transmission electron microscopy
- 31 March 1989
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 109, 157-160
- https://doi.org/10.1016/0921-5093(89)90580-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Antiphase boundaries in GaAsApplied Physics Letters, 1985
- Aluminum Nitride-An Alternative Ceramic Substrate for High Power Applications in MicrocircuitsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1984
- Role of Y2O3 and SiO2 Additions in Sintering of AINJournal of the American Ceramic Society, 1974