Two-dimensional current percolation in nanocrystalline vanadiumdioxide films
- 20 February 2006
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 88 (8) , 081902
- https://doi.org/10.1063/1.2175490
Abstract
Simultaneous measurements of the transmittance and the resistance were carried out on 20-nm-thick wires during the semiconductor-to-metal transition (SMT). They reveal an offset between the effective electrical and optical switching temperatures. This shift is due to current percolation through a network of nanometer-scale grains of different sizes undergoing a SMT at distinct temperatures. An effective-medium approximation can model this behavior and proves to be an indirect method to calculate the surface coverage of the films.
Keywords
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