Simultaneous determination of dispersion relation and depth profile of thorium fluoride thin film by spectroscopic ellipsometry
- 1 December 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 166, 325-334
- https://doi.org/10.1016/0040-6090(88)90394-x
Abstract
No abstract availableKeywords
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