Charge diffusion effects in CCD X-ray detectors
- 1 November 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 216 (3) , 431-438
- https://doi.org/10.1016/0167-5087(83)90510-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Noise reduction techniques for CCD image sensorsJournal of Physics E: Scientific Instruments, 1982
- Signal Processing for Semiconductor DetectorsIEEE Transactions on Nuclear Science, 1982
- X-ray imaging with a charge-coupled device fabricated on a high-resistivity silicon substrateApplied Physics Letters, 1981
- The effect of sea level cosmic rays on electronic devicesJournal of Applied Physics, 1981
- Single photon x-ray detection with a CCD image sensorReview of Scientific Instruments, 1979
- Measurements of the Average Energy Per Electron-Hole Pair Generation in Silicon between 5-320°KIEEE Transactions on Nuclear Science, 1972