On the matching behavior of MOSFET small signal parameters

Publisher Website

7 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/icmts.2000.844420

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Modeling statistical dopant fluctuations in MOS transistors
IEEE Transactions on Electron Devices, 1998
Quality assurance and upgrade of analog characteristics by fast mismatch analysis option in network analysis environment
IEEE Journal of Solid-State Circuits, 1993
Characterisation and modeling of mismatch in MOS transistors for precision analog design
IEEE Journal of Solid-State Circuits, 1986