Peak temperature during turnover and the volumetric degradation of switching transistors and IC-s
- 1 April 1974
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 13 (2) , 103-118
- https://doi.org/10.1016/0026-2714(74)90561-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Experiments concerning the life testing of transistors—IMicroelectronics Reliability, 1971
- Experiments concerning the life testing of semiconductor devices—II. Life testing of transistors in switching operation modeMicroelectronics Reliability, 1971