Current DLTS with a Bipolar Rectangular Weighting Function for a Neutron-Irradiated P-Type Si
- 1 February 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (2R)
- https://doi.org/10.1143/jjap.22.371
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Current transient spectroscopy: A high-sensitivity DLTS systemIEEE Transactions on Electron Devices, 1980
- Studies of Neutron-Produced Defects in Silicon by Deep-Level Transient SpectroscopyJapanese Journal of Applied Physics, 1979
- Deep-level spectroscopy in high-resistivity materialsApplied Physics Letters, 1978
- Determination of deep levels in Cu-doped GaP using transient-current spectroscopyJournal of Applied Physics, 1976
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974