Track structure effects at p-n junctions in microelectronic circuits
- 1 January 1989
- journal article
- Published by Elsevier in International Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements
- Vol. 16 (2-3) , 197-204
- https://doi.org/10.1016/1359-0189(89)90050-2
Abstract
No abstract availableKeywords
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