Microwave diamagnetic resonance associated with polysiloxanes

Abstract
Diamagnetic resonance has been observed at 9·3 gc/s and 23 gc/s with thin films of several methyl-phenyl substituted siloxanes. The films (thickness v = eB/2πm*c (where m* = 1·000 ± 0·001m e). The mean collision lifetime at low power is τ ∼ 10-9 sec. The lifetime is relatively insensitive to ambient gas pressures in the range from less than 5 × 10-6 torr to 0·2 torr and to cavity temperatures in the range from 300°k to 20°k. Results of application to the films of d.c. electric fields are described. A tentative interpretation of the phenomena is given.

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