Recovery Time Measurements on Point-Contact Germanium Diodes
- 1 May 1955
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 43 (5) , 603-607
- https://doi.org/10.1109/jrproc.1955.278105
Abstract
The use of point-contact diodes in computer circuitry has shown that diode transient response is important in circuitry employing fast waveforms. Diodes which are pulsed in the back direction from a forward-conducting state may require microseconds to attain a specified back resistance. Transient response depends on circuit impedance and operating conditions, as well as on the diodes themselves. The present lack of ready extrapolation from one transient situation to another requires different tests and criteria for the determination of diode applicability to varying situations. The development and acceptance of a limited number of broadly applicable standard pulse tests is necessary.Keywords
This publication has 2 references indexed in Scilit:
- Recovery Currents in Germanium p — n Junction DiodesJournal of Applied Physics, 1953
- Recombination Rate in Germanium by Observation of Pulsed Reverse CharacteristicPhysical Review B, 1953