A low-temperature total electron yield detector for x-ray absorption fine structure spectra
- 1 December 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (12) , 3667-3669
- https://doi.org/10.1063/1.1144489
Abstract
A design of a total electron yield detector to collect x-ray absorption fine structure spectra between 80 K and room temperature is described. In addition, a three-stage goniometer setup has been incorporated into the detector to facilitate manipulation of the sample. The results of simple linearity checks to investigate the detector’s electrical performance are presented. Finally, the detector’s thermal stability is discussed.Keywords
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