Spectroscopic IR ellipsometry with imperfect components
- 1 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 234 (1-2) , 323-326
- https://doi.org/10.1016/0040-6090(93)90278-w
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Calibration method for rotating-analyzer ellipsometersJournal of the Optical Society of America A, 1988
- Transmission Properties of Grid PolarizersApplied Optics, 1973