Lateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position
- 27 February 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 54 (9) , 801-803
- https://doi.org/10.1063/1.100851
Abstract
A technique is described for measurement of lateral forces on a scanning tunneling microscopy (STM) tip simultaneously with surface topography, using optical sensing of the STM tip vibration. The STM tip is caused to vibrate near a resonant mode in the lateral direction, using the capacitive forces between the tip and the surface under study. Topography is monitored using the z-displacement feedback voltage, in a low-frequency loop, while optical sensing of the high-frequency tip vibration amplitude monitors lateral forces acting on the tip.Keywords
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