Scanning Wiener-fringe microscope with an optical fiber tip
- 1 August 1992
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 31 (22) , 4515-4518
- https://doi.org/10.1364/ao.31.004515
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- Photon scanning tunneling microscopyReview of Scientific Instruments, 1990
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- Model for reflection near field optical microscopyApplied Optics, 1990
- Deposition and imaging of localized charge on insulator surfaces using a force microscopeApplied Physics Letters, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Development of a 500 Å spatial resolution light microscopeUltramicroscopy, 1984
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982