Optical Constant Determination of Thin Polymer Films in the Infrared
- 1 May 1985
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 39 (3) , 405-408
- https://doi.org/10.1366/0003702854248539
Abstract
Thin films of poly(vinyl chloride), poly(methyl methacrylate), and poly(styrene) were analyzed by Fourier transform infrared spectroscopy. The interference fringes present in the transmission spectra of these samples were used to determine film thickness and average refractive index. Subsequent Kramers-Kronig analysis of these transmission spectra provided the dispersion of the refractive index and the absorption index across the entire mid-infrared region. Interference fringes were absent in the optical constant spectra, and good agreement was obtained between our optical constant spectra and those of other authors.Keywords
This publication has 19 references indexed in Scilit:
- Optical effects resulting from deep implants of silicon with nitrogen and phosphorusRadiation Effects, 1980
- Optical interference method for the approximate determination of refractive index and thickness of a transparent layerApplied Optics, 1978
- Transmittance and reflectance of a coated substrate with application to index measurement of thin filmsJournal of Applied Physics, 1978
- The control of errors in i.r. spectrophotometry—III. Transmission measurements using thin cellsSpectrochimica Acta Part A: Molecular Spectroscopy, 1976
- Some problems in infrared spectrophotometryJournal of Molecular Structure, 1973
- Determination of Refractive Index and Film Thickness from Interference FringesApplied Optics, 1971
- Evaluation of Refractive Index from Interference-Fringe Transmission SpectraJournal of the Optical Society of America, 1970
- Vibrational Intensities XXV: Some Systematic Errors in Infrared Absorption Spectrophotometry of Liquid SamplesApplied Spectroscopy, 1970
- Absolute Infrared Intensity Measurements in Thin FilmsThe Journal of Chemical Physics, 1961
- Simple Interferometer for Dispersion Measurements of Liquids in the 2–22 μ RegionJournal of the Optical Society of America, 1958