The micro-wear technique and its application to ultrathin film systems
- 3 March 1994
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 9 (3) , 805-811
- https://doi.org/10.1557/jmr.1994.0805
Abstract
A micro-wear testing technique has been developed by incorporating a piezoelectric pusher into an existing microindenter system. The pusher and its associated servo-control circuitry were designed to generate a precise reciprocating horizontal motion at the indenter tip for implementing a microscaled wear test. The information acquired from the test includes the wear loading curve, i.e., the normal applied load versus wear penetration depth, the friction force, and in turn, the apparent wear friction coefficient. Measuring the electrical resistance across the coating thickness is also possible if an electrical conducting indenter is utilized. Furthermore, in conjunction with the surface characterization tools, the wear morphology revealed useful information regarding the coating failure mechanism(s) and shed some light toward understanding coating tribology. The tester design concepts, operating procedure, data acquisition, and analysis will be examined. Experimental results on ultrathin carbon coatings with various thicknesses will be employed to illustrate the capabilities of the micro-wear tester.Keywords
This publication has 7 references indexed in Scilit:
- The a.c. indentation technique and its applicationsMaterials Chemistry and Physics, 1993
- Microindentation fatigue tests on submicron carbon filmsSurface and Coatings Technology, 1991
- Microscratch and load relaxation tests for ultra-thin filmsJournal of Materials Research, 1991
- The effect of the interfacial strength on the mechanical properties of aluminum filmsThin Solid Films, 1990
- Microhardness and microstructure of ion-beam-sputtered, nitrogen-doped NiFe filmsThin Solid Films, 1988
- A method for interpreting the data from depth-sensing indentation instrumentsJournal of Materials Research, 1986
- Hardness measurement at penetration depths as small as 20 nmPhilosophical Magazine A, 1983