Photoelectron paramagnetic resonance ofin silicon
- 15 October 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 36 (11) , 6202-6205
- https://doi.org/10.1103/physrevb.36.6202
Abstract
The center in silicon has been identified by its characteristic electron-paramagnetic-resonance (EPR) signal. From photo-EPR measurements, the optical cross sections of holes for the Pt(0/-) transition have been determined at K. A comparison with corresponding optical cross sections obtained for the commonly observed deep acceptor level in Pt-doped Si at K with junction space-charge methods shows that the center is, indeed, the impurity which gives rise to the eV acceptor level.
Keywords
This publication has 14 references indexed in Scilit:
- Influence of hydrostatic pressure on the platinum levels in siliconPhysical Review B, 1986
- Zeeman and piezospectroscopy studies of the 811 meV no-phonon line structure in platinum-doped siliconJournal of Physics C: Solid State Physics, 1986
- Deep states associated with platinum in silicon: A photoluminescence studyPhysical Review B, 1986
- Palladium- and platinum-related levels in silicon: Effect of a hydrogen plasmaJournal of Applied Physics, 1983
- Strain-modulated ESR study ofin siliconPhysical Review B, 1983
- Measurement of minority carrier capture cross sections and application to gold and platinum in siliconJournal of Applied Physics, 1982
- Energy Levels in SiliconAnnual Review of Materials Science, 1980
- Electrical properties of platinum in siliconJournal of Applied Physics, 1979
- Photoionization cross sections in platinum-doped siliconJournal of Applied Physics, 1977
- Spin Resonance of Pd and Pt in SiliconPhysical Review B, 1962