Photoelectron paramagnetic resonance ofPtin silicon

Abstract
The Pt center in silicon has been identified by its characteristic electron-paramagnetic-resonance (EPR) signal. From photo-EPR measurements, the optical cross sections of holes for the Pt(0/-) transition have been determined at T=4.2 K. A comparison with corresponding optical cross sections obtained for the commonly observed deep acceptor level in Pt-doped Si at T=80 K with junction space-charge methods shows that the Pt center is, indeed, the impurity which gives rise to the Ec0.23 eV acceptor level.