Defect tolerance and yield for a WSI rapid prototyping architecture
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Novel reciprocal and square-root VLSI cell: architecture and application to signal processingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1991
- Integrated circuit yield statisticsProceedings of the IEEE, 1983