Frequency enhancement of digital VLSI test systems
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 444-451
- https://doi.org/10.1109/test.1990.114053
Abstract
The authors first discuss the intrinsic frequency limitations of the wave formatters, DUT (device-under-test) drivers, and comparators in a typical 1980s 40-80-MHz test system, and in two lower cost (<K-per-pin) systems. They then explain how the frequency of operation can be enhanced up to 700 Mb/s with a, small amount of additional GaAs circuitry for multiplexing DUT drivers. In cases in which the comparators have a restricted bandwidth, an external GaAs comparator can be used. The technical limitations and cost considerations of frequency enhancement techniques are discussed.Keywords
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