Quantification of partially recrystallized polycrystals using electron backscatter diffraction
- 31 January 1995
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 190 (1-2) , 241-246
- https://doi.org/10.1016/0921-5093(94)09601-r
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Orientation imaging: The emergence of a new microscopyMetallurgical Transactions A, 1993
- Microtexture determination by electron back-scatter diffractionJournal of Materials Science, 1992
- Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscopePhilosophical Magazine, 1973
- Some geometrical relations in dislocated crystalsActa Metallurgica, 1953