Mobility of electrons in a quantized silicon inversion layer due to phonon scattering
- 15 December 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 22 (12) , 6325-6329
- https://doi.org/10.1103/physrevb.22.6325
Abstract
A theory for the mobility limited by lattice scattering in a quantized silicon inversion layer is developed in this paper. The expression for the relaxation time for scattering of a degenerate two-dimensional electron gas by a nonpolar optic phonon is derived from the Boltzmann equation and is found to differ from those given by other workers. The wave vectors of different phonons participating in the intersubband and intervalley transitions in a (100)-oriented silicon surface are then estimated by following a geometrical construction and considering the lowest three subbands. The dispersion curves for bulk phonons are used to determine the phonon temperatures. By taking an acoustic phonon and an averaged low-energy and an averaged high-energy phonon, the mobility is calculated by using both the nondegenerate and degenerate statistics. It is found that the mobility values are different for the two cases even at 300 K.Keywords
This publication has 28 references indexed in Scilit:
- The dynamics of conduction electrons in surface space charge layersPublished by Springer Nature ,2007
- Quantum transport in silicon inversion layersPublished by Springer Nature ,2007
- Effect of Coulomb scattering on silicon surface mobilityJournal of Applied Physics, 1974
- Transport properties of conduction electrons in n-type inversion layers in (100) surfaces of siliconJournal of Physics and Chemistry of Solids, 1974
- Quantum properties of surface space-charge layersC R C Critical Reviews in Solid State Sciences, 1973
- Relative importance of phonon scattering to carrier mobility in Si surface layer at room temperatureJournal of Applied Physics, 1973
- On the role of scattering by surface roughness in silicon inversion layersSurface Science, 1973
- Scattering of charge carriers in silicon surface layersJournal of Applied Physics, 1973
- Mobility Anisotropy of Electrons in Inversion Layers on Oxidized Silicon SurfacesPhysical Review B, 1971
- Transport Properties of Electrons in Inverted Silicon SurfacesPhysical Review B, 1968