A study of radiation effects on reoxidized nitrided oxide MOSFETs, including effects on mobility
- 30 September 1993
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 36 (9) , 1359-1361
- https://doi.org/10.1016/0038-1101(93)90179-t
Abstract
No abstract availableKeywords
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