Impact of nitridation/reoxidation on performance degradation in n-MOSFETs under Fowler-Nordheim injection
- 1 January 1992
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 35 (1) , 95-102
- https://doi.org/10.1016/0038-1101(92)90310-9
Abstract
No abstract availableKeywords
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