Optical properties of stannous oxide thin films
- 1 February 1992
- journal article
- letter
- Published by Springer Nature in Czechoslovak Journal of Physics
- Vol. 42 (2) , 235-239
- https://doi.org/10.1007/bf01606374
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Determination of surface roughness and optical constants of inhomogeneous amorphous silicon filmsJournal of Physics E: Scientific Instruments, 1984
- Determination of the thickness and optical constants of amorphous siliconJournal of Physics E: Scientific Instruments, 1983
- On the determination of optical constants of filmsJournal of Physics D: Applied Physics, 1979
- Validity of spectrophotometric determination of refractive indices for thin dielectric films and their thicknessesActa Physica Academiae Scientiarum Hungaricae, 1977