Fluctuations in the Temperature Dependence of the Resistance of a One-Dimensional System

New effects are predicted to occur in the resistance of a one-dimensional system when the inelastic scattering time becomes longer than the transit time of a carrier through the system. While the mean behavior of $R\left(T\right)\mathrm{}$ is the same as in the multiple-hopping regime, the fluctuations in $R\left(T\right)\mathrm{}$ change dramatically, depending logarithmically on the length. The behavior of $R\left(T\right)\mathrm{}$ can give a detailed reconstruction of the microscopic eigenstates of the system.