Charge distributions in silicon nitride of MNOS devices

This publication has 7 references indexed in Scilit:

• Theory of MNOS memory transistor
  IEEE Transactions on Electron Devices, 1977
• Simple technique for determination of centroid of nitride charge in MNOS structures
  Applied Physics Letters, 1975
• Silicon nitride trap properties as revealed by charge−centroid measurements on MNOS devices
  Applied Physics Letters, 1975
• Measurements of charge propagation in Si3N4 films
  Applied Physics Letters, 1974
• Direct display of electron back tunneling in MNOS memory capacitors
  Applied Physics Letters, 1973
• Characterization of thin-oxide MNOS memory transistors
  IEEE Transactions on Electron Devices, 1972
• Properties of MNOS structures
  IEEE Transactions on Electron Devices, 1972