The secondary electron emission characteristics of clean and contaminated copper beryllium sheet
- 1 June 1965
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 16 (6) , 889-892
- https://doi.org/10.1088/0508-3443/16/6/416
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Secondary Electron Multiplier as a Detector of Very Feeble Ion Current down to 10-19 AmperesJapanese Journal of Applied Physics, 1962
- Ionic Bombardment Cleaning of GlassNature, 1958
- The sources of electron-induced contamination in kinetic vacuum systemsBritish Journal of Applied Physics, 1954
- The origin of specimen contamination in the electron microscopeBritish Journal of Applied Physics, 1953