DC Superconducting Quantum Interference Device Utilizing the High Tc Step-Edge Junction
- 1 June 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (6B) , L1121
- https://doi.org/10.1143/jjap.30.l1121
Abstract
An artificial step-edge junction for developing the high T c weak links is presented. The step-edge junction is fabricated by using the step edge of the double layer of the epitaxial YBaCuO films. The dc superconducting quantum interference device (SQUID) made of the junction shows a clear voltage-vs-flux (V-Φ) relation up to T=81.3 K. The voltage modulation depth ΔV of the V-Φ relation is ΔV=1.6 µV at T=77 K. A preliminary experiment shows that the magnetic-flux noise of the SQUID at T=77 K is, at most, Φ n =4.4×10-4Φ0/√Hz at f=10 Hz. These results show the promising properties of the step-edge junction for the weak link of high T c superconductors.Keywords
This publication has 11 references indexed in Scilit:
- Low noise YBa2Cu3O7−δ grain boundary junction dc SQUIDsApplied Physics Letters, 1990
- All high T c edge junctions and SQUIDsApplied Physics Letters, 1990
- Josephson Current in Microbridges of YBa2Cu3O7-δ Thin Films Prepared by CVDJapanese Journal of Applied Physics, 1990
- A New Anode-Electrode Structure for Sputter Deposition of High-Quality Y-Ba-Cu-O Thin FilmsJapanese Journal of Applied Physics, 1989
- Low-noise thin-film TlBaCaCuO dc SQUIDs operated at 77 KApplied Physics Letters, 1989
- Magnetic flux noise in thin-film rings of YBa2Cu3O7−δApplied Physics Letters, 1988
- Quantum interference devices made from superconducting oxide thin filmsApplied Physics Letters, 1987
- Effect of damping resistance on voltage versus flux relation of a dc SQUID with large inductance and critical currentJournal of Applied Physics, 1985
- Planar coupling scheme for ultra low noise DC SQUIDsIEEE Transactions on Magnetics, 1981
- Superconducting weak linksReviews of Modern Physics, 1979