Error Detection Process—Model, Design, and Its Impact on Computer Performance
- 1 June 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-33 (6) , 529-540
- https://doi.org/10.1109/tc.1984.1676476
Abstract
Conventionally, reliability analyses either assume that a fault/error is detected immediately as it occurs, or ignore damage caused by imperfect detection mechanisms and error latency, namely, the time interval between the occurrence of an error and the detection of that error.Keywords
This publication has 9 references indexed in Scilit:
- Analysis of an Important Class of Non-Markov SystemsIEEE Transactions on Reliability, 1982
- An Information Theoretic Approach to Digital Fault TestingIEEE Transactions on Computers, 1981
- Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent FaultsIEEE Transactions on Computers, 1981
- A Unified Reliability Model for Fault-Tolerant ComputersIEEE Transactions on Computers, 1980
- On the Optimum Checkpoint IntervalJournal of the ACM, 1979
- A Rollback Interval for Networks with an Imperfect Self-Checking PropertyIEEE Transactions on Computers, 1978
- System structure for software fault toleranceIEEE Transactions on Software Engineering, 1975
- Analytic models for rollback and recovery strategies in data base systemsIEEE Transactions on Software Engineering, 1975
- Testing for Intermittent Faults in Digital CircuitsIEEE Transactions on Computers, 1973