Field-based scanning tunneling microscope manipulation of antimony dimers on Si(001)
- 1 January 2001
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B
- Vol. 19 (3) , 659
- https://doi.org/10.1116/1.1372925
Abstract
The manipulation of antimony dimers, on the silicon (001) surface by means of a scanning tunneling microscope (STM) has been experimentally investigated. Directed hopping of the dimers due the STM tip can dominate over the thermal motion at temperatures between 300 and 500 K. Statistics on the enhanced hopping are reported and possible tip–adsorbate models are discussed focusing on a field-based interaction. The low yield of directed hopping is believed to be due to the low gradient in the interaction energy intrinsic to a field-based mechanism. Ultimate resolution and limiting factors of this manipulation technique are discussed.
Keywords
This publication has 15 references indexed in Scilit:
- Manipulation and writing with Ag nanocrystals on Si(111)-7×7Applied Physics Letters, 1998
- Basic Steps of Lateral Manipulation of Single Atoms and Diatomic Clusters with a Scanning Tunneling Microscope TipPhysical Review Letters, 1997
- Interaction of Ga Adsorbates with Dangling Bonds on the Hydrogen Terminated Si(100) SurfaceJapanese Journal of Applied Physics, 1996
- C60 manipulation and cluster formation using a scanning tunneling microscopeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Reliable tip preparation for high-resolution scanning tunneling microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- Direct determination of surface diffusion by displacement distribution measurement with scanning tunneling microscopyPhysical Review Letters, 1993
- Field-Induced Nanometer- to Atomic-Scale Manipulation of Silicon Surfaces with the STMScience, 1991
- Manipulation of Adsorbed Atoms and Creation of New Structures on Room-Temperature Surfaces with a Scanning Tunneling MicroscopeScience, 1991
- Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-SbPhysical Review Letters, 1990
- Positioning single atoms with a scanning tunnelling microscopeNature, 1990