Resistance oscillations and crossover in ultrathin gold films
- 15 May 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (15) , 8622-8626
- https://doi.org/10.1103/physrevb.37.8622
Abstract
The resistivity of thin single-crystalline Au and Ag layers is measured during deposition onto Si(111) surfaces at 95 K from zero to several tens of monolayers and for layers from 1.5 to 12 monolayers as a function of temperature. The structure of the layers is monitored by reflection high-energy electron diffraction (RHEED). In Au layers resistance oscillations occur synchronously with RHEED intensity oscillations. They are attributed to periodic variations of the specularity factor. Below 6 monolayers a three- to two-dimensional crossover is observed.Keywords
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