Dielectric Breakdown in Perspex
- 1 September 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electrical Insulation
- Vol. EI-8 (3) , 73-75
- https://doi.org/10.1109/tei.1973.299247
Abstract
Experiments have been carried out to investigate the breakdown mechanism in Perspex over a temperature range from 20 to 160°C, using impulse voltages of widely differing rise times. The electric strength was found to be sensitive to voltage rise time, reaching a maximum as the rise time is increased, but falling again at longer rise times towards the dc value. The results are discussed in terms of a model in which space charges accumulate at the electrodes, positive charges at the anode, and negative charges at the cathode.Keywords
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