A Differential Capacitor Circuit for Very High and Low Dielectric Q-Factor Measurement at High Frequencies
- 1 December 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 22 (4) , 315-319
- https://doi.org/10.1109/tim.1973.4314180
Abstract
This paper presents an electronic circuit system that is capable of measuringdielectric Q-factor Qx (= 1/tan δ) ranging from 0.01-10 at measuring frequencies 100 kHz-30 MHz, and from 10-105 at 1-300 MHz. For measurement of very high loss materials, a tripartite differential capacitor is used as a variable resistor to substitute for low Rx, and for measurement of very low loss materials, an ordinary differential capacitor connected in series with two fixed deposited fim resistors is used to substitute for high unknown resistance Rx. An important characteristic of the circuit is its capability of measuring capacitance and resistance of high loss materials accurately.Keywords
This publication has 3 references indexed in Scilit:
- Complex Series-Condenser-Type Variable High Resistance With High-Accuracy Ichijo ResistorIEEE Transactions on Instrumentation and Measurement, 1971
- A New Method of Measuring Dielectric Property of Very-High-Loss Materials at High FrequenciesIEEE Transactions on Instrumentation and Measurement, 1970
- On the New Method of Measuring Dielectric Constant and Loss Angles of SemiconductorsJournal of Applied Physics, 1953